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| Sensitivity transverse effect for high impact accelerometer and measurement error caused by assembling |
| FENG Lei1,2，MA Tie-hua1,2 |
| 1．National Key Laboratory for Electronic Measurement Technology, North University of China, Taiyuan 030051，China； 2．Ministerial Key Laboratory of Instrumentation Science & Dynamic Measurement, North University of China, Taiyuan 030051 ,China |
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Abstract It is common that only the accelerometer is calibrated in high impact test, so the measurement error caused by the accelerometer assembling is neglected. First, analyzes the reason transverse effect arise and the instrument overall mechanical model. Use Hopkinson bar to do the impact test on each axis of the accelerometer to study the transverse effect. And then use ANSYS to analyze the instrument structural response under the load of 20000g acceleration. The results show that the instrument mechanical shell vibrates and the measurement error caused by assembling of the accelerometer cannot be neglected.
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Received: 08 January 2014
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2014, Vol. 33 
