Evaluating on the noise level of MEMS record: case study in Luding  M S6.8 earthquake
GUO Wenxuan1, REN Yefei1, YAO Xinxin1, KISHIDA Tadahiro2, 3, JIANG Peng4, WANG Hongwei1, WEN Ruizhi1
Journal of Vibration and Shock . 2024, (18): 313 -320 . 

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