Dynamic analysis of tapping mode atomic force microscopy under random noise excitation

Wu Jie;Zhang Wen-ming;Meng Guang;He Yu-hang

Journal of Vibration and Shock ›› 2012, Vol. 31 ›› Issue (3) : 8-12,4.

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PDF(1910 KB)
Journal of Vibration and Shock ›› 2012, Vol. 31 ›› Issue (3) : 8-12,4.
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Dynamic analysis of tapping mode atomic force microscopy under random noise excitation

  • Wu Jie, Zhang Wen-ming, Meng Guang, He Yu-hang
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Abstract

Nonlinear dynamic behavior of tapping mode atomic force microscope(AFM) under bounded random noise excitation is investigated. The microcantilever is modeled with a lumped-parameter model and the interaction between the microcantilever and sample is described by the Lennard-Jones (LJ) potential. Effects of the density of the random disturbance and contact angle of the meniscus force on the dynamic system are analyzed and discussed. The results indicate that various periodic and chaotic motions occur in the coupled dynamic AFM system, the dynamic system goes through a complex nonlinear behavior. As the density of the random disturbance and contact angle of the meniscus force increase, more and more chaotic components occur in the dynamic AFM system. It demonstrated that the effect of random noise cannot be ignored for the optimization design of tapping mode AFM.

Key words

MEMS/NEMS / atomic force microscope (afm) / lennard-jones potential / bounded noise / meniscus force.

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Wu Jie;Zhang Wen-ming;Meng Guang;He Yu-hang. Dynamic analysis of tapping mode atomic force microscopy under random noise excitation[J]. Journal of Vibration and Shock, 2012, 31(3): 8-12,4
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