Dynamic analysis of tapping mode atomic force microscopy under random noise excitation
Wu Jie;Zhang Wen-ming;Meng Guang;He Yu-hang
Journal of Vibration and Shock ›› 2012, Vol. 31 ›› Issue (3) : 8-12,4.
Dynamic analysis of tapping mode atomic force microscopy under random noise excitation
MEMS/NEMS / atomic force microscope (afm) / lennard-jones potential / bounded noise / meniscus force. {{custom_keyword}} /
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