Study on accelerated test for board level solder interconnects reliabilityusing vibration shock loading

LIU Yang ZHANG Hongwu SUN Fenglian ZHOU Zhen QIN Yong

Journal of Vibration and Shock ›› 2013, Vol. 32 ›› Issue (7) : 74-77.

PDF(1967 KB)
PDF(1967 KB)
Journal of Vibration and Shock ›› 2013, Vol. 32 ›› Issue (7) : 74-77.
论文

Study on accelerated test for board level solder interconnects reliabilityusing vibration shock loading

  • LIU Yang 1 ZHANG Hongwu 1 SUN Fenglian 1 ZHOU Zhen 2 QIN Yong 2
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Abstract

An accelerated test was designed for evaluating vibration shock resistance of board level solder interconnects. Vibration was loaded upon PCB in cyclic sinusoidal wave mode with single frequency. Vibrating condition was adjusted to simulate drop impact loading amplitude. Loading intensities was characterized using strain measurements. The solder failure process was recorded with a high speed data acquisition system. Results show that a similar loading intensity of drop impact could be obtained using vibration shock method. The loading repetition frequency of vibration shock is higher than that of drop impact. Solder interconnects appeared fatigue characteristic during accelerated failure test. The accelerated test in this work increased the test efficiency with no failure mode shift. Hence, it could be an alternative method for board level shock reliability evaluation.

Key words

board level package / solder / vibration shock / accelerated failure

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LIU Yang ZHANG Hongwu SUN Fenglian ZHOU Zhen QIN Yong . Study on accelerated test for board level solder interconnects reliabilityusing vibration shock loading[J]. Journal of Vibration and Shock, 2013, 32(7): 74-77
PDF(1967 KB)

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